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Unified Methods For VLSI Simulation And Test Generation

By: Contributor(s): Material type: TextLanguage: English Publication details: 1989 Kluwer Academic PublishersDescription: 148ISBN:
  • 0-7923-9025-3
DDC classification:
  • 621.39'5 CHE
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Holdings
Cover image Item type Current library Home library Collection Shelving location Call number Materials specified Vol info URL Copy number Status Notes Date due Barcode Item holds Item hold queue priority Course reserves
Books Cummins College of Engineering for Women Pune 621.39'5 (Browse shelf(Opens below)) Ref 1618 E (50571) Reference (not for issue) 050571 CCEP-BK-50571

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