TY  - BOOK
AU  - Sun Y.(Editor)
AU  - Sun Y.(Editor)
TI  - Test And Diagnosis Of Analogue, Mixed-Signal And RF Integrated Circuits: The System On Chip Approach
SN  - 9780863417450
U1  - 621.3815 
PY  - 2012///
PB  - Institution of Engineering and Technology
ER  -