00430nam a2200145Ia 4500008004100000020001800041041000800059082001800067100002100085245006000106260003700166300002800203365001700231700003600248230718s9999    xx            000 0 und d  a0-7923-9025-3  aeng  a621.39'5bCHE  aCheng Kwang-Ting  aUnified Methods For VLSI Simulation And Test Generation  c1989bKluwer Academic Publishers  a148dRef 1618 E (50571)  cRs.b6338.00  aCheng Kwang-Ting & Agrawal V.D.